1. Simultaneous determination of Ag, Sn, B, Mo, Pb, Zn, Ni, Cu and other elements in geological samples; it can also be used for the detection of trace precious metal elements in geological samples (after separation and enrichment);
2. Determination of several to dozens of impurity elements in high-purity metals and high-purity oxides, powder samples such as tungsten, molybdenum, cobalt, nickel, tellurium, bismuth, indium, tantalum, niobium, etc.;
3. Analysis of trace and trace elements in insoluble powder samples such as ceramics, glass, coal ash, etc.
One of the indispensable supporting analysis programs for geochemical exploration samples
Ideal for detection of impurity components in high-purity substances
Efficient Optical Imaging System
Ebert-Fastic optical system and three-lens optical path are adopted to effectively remove stray light, eliminate halo and chromatic aberration, reduce background, enhance light gathering ability, good resolution, uniform spectral line quality, and fully inherit the optical path of a one-meter grating spectrograph The advantages.
AC and DC arc excitation light source
It is convenient to switch between AC and DC arcs. According to different samples to be tested, selecting the appropriate excitation mode is beneficial to improve the analysis and test results. For non-conductive samples, select AC mode, and for conductive samples, select DC mode.
The upper and lower electrodes automatically move to the designated position according to the software parameter settings, and after the excitation is completed, remove, and replace the electrodes, which is easy to operate and has high alignment accuracy.
The patented electrode imaging projection technology displays all the excitation process on the observation window in front of the instrument, which is convenient for users to observe the excitation of the sample in the excitation chamber, and helps to understand the properties and excitation behavior of the sample.
Optical path form |
Vertically symmetrical Ebert-Fastic type |
Current range |
2~20A(AC) 2~15A(DC) |
Plane Grating Lines |
2400 pieces/mm |
Excitation light source |
AC/DC arc |
Optical path focal length |
600mm |
Weight |
About 180Kg |
Theoretical spectrum |
0.003nm (300nm) |
Dimensions (mm) |
1500(L)×820(W)×650(H) |
Resolution |
0.64nm/mm (first class) |
Constant temperature of spectroscopic chamber |
35OC±0.1OC |
Falling Line Dispersion Ratio |
Synchronous high-speed acquisition system based on FPGA technology for high-performance CMOS sensor |
Environmental conditions |
Room temperature 15 OC~30 OC Relative humidity<80% |